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Development and Application of Connector Contact Material Systems for Elevated Temperature Exposure

Philip W. Lees
Technical Materials, Inc.
Lincoln, RI 02865

Abstract: This paper will discuss the development, testing, and application of connector contact material systems based on maximum sustained exposure temperature. Low-level circuit resistance (LLCR) data was used to qualify systems capable of functioning at or below the following temperature thresholds: 100oC, 125oC, 150oC, 200oC, 350oC, and beyond. The contact materials include electroplated soft Au, Co, and Ni hardened Au, electroplated Au flash Pd and PdNi, and wrought alloys including WE#1, PdAg, PdNi, DGR156, and AuPdAg.

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